SEM

Scanning Electron Microscopes

Microscopes for Electron Microscopy Sciences

Scanning Electron Microscopes

Scanning Electron Microscopes (SEM) by Carl Zeiss deliver high resolution surface information and superior materials contrast. They are widely used in many application fields such as nanotechnology, materials analysis, semiconductor failure analysis, life sciences and quality assurance.

EVO for Electron Microscopy

EVO

The EVO series of SEMs have evolved to meet the challenges in electron microscopy. These systems are ideally used for applications in materials analysis and life sciences.

EVO for Materials
EVO for Life Sciences
EVO HD for Materials
EVO HD for Life Sciences

SIGMA

Advanced Analytical Electron Microscopy. Profit from SIGMA FE-SEM superb low voltage imaging and ultra stable probe currents for analytical applications.

SIGMA for Materials

SIGMA for Life Sciences

MERLIN Compact

MERLIN Compact - your multi- purpose high resolution imaging and nano-analysis workhorse for challenging samples. Combine unparalleled materials contrasts with options such as AFM, real time 3D surface visualization, and local charge compensation.

MERLIN Compact for Materials

MERLIN Compact for Life Sciences

MERLIN

MERLIN is the flagship field emission scanning electron microscope for the sub nanometer world. MERLIN combines ultra-high resolution imaging and highest beam currents for ultra fast nano-analytics in one single platform.

MERLIN for Materials

MERLIN for Life Sciences

SUPRA

Ultra high resolution FE-SEM for versatile analytics.
SUPRA for Materials

Microscope Upgrades

Upgrades

Available Upgrades for Electron Microscopes.
Upgrades

ULTRA

The ultimate lab tool to meet the most demanding requirements.
ULTRA for Materials

Certified Refurbished Instruments

Fully refurbished electron microscopes with guaranteed performance at exceptional value.
Refurbished Instruments

Process-Specific Tools

Scanning Electron Microscopes tailored to your requirements and adaptable to your needs.
ParticleSCAN for Particle Analysis
JetSCAN for Engine Failure Analysis